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Journal Articles

Effects of a corrosion inhibitor on the corrosion of steels under thin solution layers

Momma, Yuichiro*; Sakairi, Masatoshi*; Ueno, Fumiyoshi; Otani, Kyohei

Zairyo To Kankyo, 71(5), p.133 - 137, 2022/05

The effect of the corrosion inhibitor on the corrosion of steel under a thin solution layer was investigated. As a result of forming a thin solution layer with a thickness of 1.0-0.2 mm on the specimen, adding a mixed solution of sodium molybdate and aluminum lactate as a corrosion inhibitor, and performing electrochemical measurement, the corrosion inhibitor suppresses the anodic reaction. And in the thin solution layer, it was suggested that the morphology of the protective layer structure by the corrosion inhibitor changed according to the amount of liquid as compared with the bulk immersion.

Journal Articles

Electrochemical behavior of carbon steels under thickness-controlled solution layer

Momma, Yuichiro*; Sakairi, Masatoshi*; Ueno, Fumiyoshi; Otani, Kyohei

Zairyo To Kankyo, 71(4), p.121 - 125, 2022/04

The effect of solution layer thickness on the atmospheric corrosion of carbon steel was investigated using novel devices fabricated by a 3D printer. These novel devices allowed us to control the solution layer thickness precisely. Potentiodynamic polarization measurements were performed under thickness-controlled solution layer, and oxygen diffusion limiting current density ($$j_{rm lim}$$) and anodic current density ($$j_{rm anode}$$) were measured. As the solution layer become thinner, $$j_{rm lim}$$ increased and $$j_{rm anode}$$ decreased. This result indicates that corrosion accelerates when the solution layer becomes thinner. The diffusion coefficient of oxygen was calculated as 3.20$$times$$10$$^{-5}$$ cm$$^{2}$$ s$$^{-1}$$ from the relationship between $$j_{rm lim}$$ and solution layer thickness, and the critical diffusion thickness was estimated to be 0.87 mm.

Journal Articles

Development of spin-contrast-variation neutron reflectometry

Kumada, Takayuki; Akutsu, Kazuhiro*; Oishi, Kazuki*; Morikawa, Toshiaki*; Kawamura, Yukihiko*; Sahara, Masae*; Suzuki, Junichi*; Miura, Daisuke*; Torikai, Naoya*

J-PARC 20-02; J-PARC MLF Annual Report 2019, p.38 - 40, 2021/00

Journal Articles

Dynamic nuclear self-polarization of III-V semiconductors

Koizumi, Mitsuo; Goto, Jun*; Matsuki, Seishi*

Journal of Semiconductors, 39(8), p.082001_1 - 082001_5, 2018/08

Dynamic nuclear self-polarization (DYNASP) is a phenomenon observed in III-V semiconductors. When electrons of the valence band of a semiconductor are optically excited to the conduction band, a relaxation process of the conduction electrons induces a large nuclear polarization to suddenly occur below a critical temperature. Extending the original theoretical work of Dyakonov et al., we examined the effect of spin distribution of valence electrons excited by the circularly polarized light and the effect of external magnetic field on the phenomenon of the nuclear self-polarization. We found that the nuclear polarization is achieved even above the critical temperatures by the effect of electron polarization and of the external magnetic field. To investigate the phenomenon experimentally, we constructed an apparatus for low-temperature experiments.

Oral presentation

Current status for the search of time-reversal symmetry violation using compound nuclear reactions

Endo, Shunsuke; Kimura, Atsushi; Shimizu, Hirohiko*; Fujioka, Hiroyuki*; Ide, Ikuo*; Sakai, Kenji; Kameda, Kento*; Kitaguchi, Masaaki*; Iinuma, Masataka*; Kawamura, Shiori*; et al.

no journal, , 

Oral presentation

Electrochemical behavior of carbon steel under controlled-thickness chloride-containing water films

Sakairi, Masatoshi*; Onozawa, Kento*; Otani, Kyohei; Ueno, Fumiyoshi

no journal, , 

no abstracts in English

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